JPS632236Y2 - - Google Patents

Info

Publication number
JPS632236Y2
JPS632236Y2 JP1979032146U JP3214679U JPS632236Y2 JP S632236 Y2 JPS632236 Y2 JP S632236Y2 JP 1979032146 U JP1979032146 U JP 1979032146U JP 3214679 U JP3214679 U JP 3214679U JP S632236 Y2 JPS632236 Y2 JP S632236Y2
Authority
JP
Japan
Prior art keywords
spherical
electron beam
airtight chamber
airtight
charged particle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1979032146U
Other languages
English (en)
Japanese (ja)
Other versions
JPS55134084U (en]
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1979032146U priority Critical patent/JPS632236Y2/ja
Publication of JPS55134084U publication Critical patent/JPS55134084U/ja
Application granted granted Critical
Publication of JPS632236Y2 publication Critical patent/JPS632236Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Welding Or Cutting Using Electron Beams (AREA)
JP1979032146U 1979-03-12 1979-03-12 Expired JPS632236Y2 (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1979032146U JPS632236Y2 (en]) 1979-03-12 1979-03-12

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1979032146U JPS632236Y2 (en]) 1979-03-12 1979-03-12

Publications (2)

Publication Number Publication Date
JPS55134084U JPS55134084U (en]) 1980-09-24
JPS632236Y2 true JPS632236Y2 (en]) 1988-01-20

Family

ID=28885103

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1979032146U Expired JPS632236Y2 (en]) 1979-03-12 1979-03-12

Country Status (1)

Country Link
JP (1) JPS632236Y2 (en])

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3088203B1 (fr) * 2018-11-09 2023-08-25 Sidel Participations Procede et dispositif de sterilisation par irradiation d'un recipient en matiere thermoplastique

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5518593B2 (en]) * 1972-03-02 1980-05-20
JPS5711752B2 (en]) * 1974-04-17 1982-03-06

Also Published As

Publication number Publication date
JPS55134084U (en]) 1980-09-24

Similar Documents

Publication Publication Date Title
US7884326B2 (en) Manipulator for rotating and translating a sample holder
JP2014239037A (ja) 荷電粒子装置内の試料を撮像する方法
EP3973559B1 (en) Diffractometer for charged-particle crystallography
TW201624520A (zh) 複合帶電粒子束裝置
JP2019160575A (ja) イオンミリング装置及び試料ホルダー
JPS632236Y2 (en])
US9947506B2 (en) Sample holder and focused ion beam apparatus
JP2007188905A (ja) 荷電粒子線装置用試料ホールダ
JPWO2017134764A1 (ja) 試料ホルダ、イオンミリング装置、試料加工方法、試料観察方法、及び試料加工・観察方法
JP2007188821A (ja) ハンディ電子顕微鏡
US4101778A (en) Rod-shaped specimen holder for an optical corpuscular-beam apparatus
US10269534B2 (en) Mask position adjustment method of ion milling, electron microscope capable of adjusting mask position, mask adjustment device mounted on sample stage and sample mask component of ion milling device
JP2000090862A (ja) Ｘ線管
JP3106846U (ja) 荷電粒子線装置用試料ホールダ
JP2002319365A (ja) ステージ及びｆｉｂ試料作成装置
JP3667884B2 (ja) 局所分析装置
JPH09306403A (ja) 試料処理装置
US20240246078A1 (en) Material transfer device and method
JP3865752B2 (ja) 局所分析装置
JP4037596B2 (ja) 荷電粒子ビーム装置
JPH08162057A (ja) 荷電粒子線装置
JP2008257929A (ja) ビーム加工装置およびビーム観察装置
JPH0515120Y2 (en])
JPS5850610Y2 (ja) 電子顕微鏡等における試料装置
HK40066601B (en) Diffractometer for charged-particle crystallography